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Surface Characterization in Engineering Curricula
Author(s) -
Michael G. Mauk,
Richard Chiou,
Shraman Kadapa,
Tzu-Liang Tseng
Publication year - 2018
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18260/1-2--28890
Subject(s) - characterization (materials science) , stylus , materials science , surface roughness , surface metrology , metrology , surface finish , optics , interferometry , profilometer , computer science , engineering drawing , mechanical engineering , nanotechnology , engineering , composite material , computer vision , physics
Dr. Richard Chiou is Associate Professor within the Engineering Technology Department at Drexel University, Philadelphia, USA. He received his Ph.D. degree in the G.W. Woodruff School of Mechanical Engineering at Georgia Institute of Technology. His educational background is in manufacturing with an emphasis on mechatronics. In addition to his many years of industrial experience, he has taught many different engineering and technology courses at undergraduate and graduate levels. His tremendous research experience in manufacturing includes environmentally conscious manufacturing, Internet based robotics, and Web based quality. In the past years, he has been involved in sustainable manufacturing for maximizing energy and material recovery while minimizing environmental impact.

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