Open AccessA Comparison between Two All-Terminal Reliability Algorithms
Author(s) -
Willem Pino,
Teresa Gomes,
Robert E. Kooij
Publication year - 2015
Publication title -
journal of advances in computer networks
Language(s) - English
Resource type - Journals
ISSN - 1793-8244
DOI - 10.18178/jacn.2015.3.4.183
Subject(s) - computer science , terminal (telecommunication) , reliability (semiconductor) , algorithm , reliability engineering , computer network , physics , power (physics) , quantum mechanics , engineering
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