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The Fluorescence Intensity Ratios of Superconducting FeySe1-XTeX Thin Films
Author(s) -
Canan Aksoy,
E. Tıraşoğlu,
Susannah Speller,
C.R.M. Grovenor
Publication year - 2017
Publication title -
cumhuriyet science journal
Language(s) - Turkish
Resource type - Journals
eISSN - 2587-246X
pISSN - 2587-2680
DOI - 10.17776/csj.363587
Subject(s) - thin film , superconductivity , analytical chemistry (journal) , fluorescence , intensity (physics) , sputtering , materials science , resolution (logic) , single crystal , crystal (programming language) , chemistry , optics , crystallography , condensed matter physics , nanotechnology , physics , chromatography , artificial intelligence , computer science , programming language
Superiletken Fe y Se 1-x Te x ince filmleri MgO altliklar uzerine Rf puskurtme yontemi kullanilarak uretildi ve uretim kosullarinin ince filmlerin mikroyapisi uzerindeki farkliliklari incelendi. Bunun yanisira uretilen ince filmlerin Te IKβ/IKα fluorescence siddet oranlari  tahripsiz EDXRF spektroskopisi kullanilarak calisildi. Fe y Se 1-x Te x ince filmleri 59,5 keV enerjili  radyoaktif 241-Am kaynagindan yayilan  γ-fotonlari  ile uyarildi ve 5.9 keV’ta rezulasyonu 150eV olan Ultra-LEGe dedektoru ile veriler tespit edildi. Elde edilern sonuclar, vakum ve Ar atmosferi basincinin numunelerin Te siddet oranlarininin degisimine sebep olabilecegini gosterdi.

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