Exploration of hot switching damage and damage mechanisms in MEMS switch contacts
Author(s) -
R. P. Hennessy
Publication year - 2013
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.17760/d20003329
Subject(s) - microelectromechanical systems , ohmic contact , electrical contacts , signal (programming language) , materials science , electrical engineering , optical switch , switching time , crossover switch , optoelectronics , electronic engineering , engineering , nanotechnology , computer science , layer (electronics) , programming language
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