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Modeling and boundary force control of microcantilevers utilized in atomic force microscopy for cellular imaging and characterization
Author(s) -
Sohrab Eslami
Publication year - 2011
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.17760/d20002045
Subject(s) - characterization (materials science) , van der waals force , atomic force microscopy , nanotechnology , microscopy , materials science , kelvin probe force microscope , physics , optics , molecule , quantum mechanics

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