Open AccessAn SPM based tester for the study of micro-contacts
Author(s) -
Nikhil Joshi
Publication year - 2010
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.17760/d20000955
Subject(s) - materials science , electrical contacts , contact resistance , pillar , contact force , nanotechnology , composite material , contact angle , microelectromechanical systems , stack (abstract data type) , plasma cleaning , metal , optoelectronics , plasma , mechanical engineering , layer (electronics) , metallurgy , engineering , physics , quantum mechanics , computer science , programming language
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