Open AccessReliability-aware placement and routing for FPGAs
Author(s) -
M. Abdul-Aziz
Publication year - 2010
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.17760/d20000905
Subject(s) - soft error , single event upset , reliability (semiconductor) , reliability engineering , very large scale integration , field programmable gate array , computer science , routing (electronic design automation) , embedded system , upset , affect (linguistics) , event (particle physics) , computer hardware , engineering , psychology , electronic engineering , static random access memory , mechanical engineering , power (physics) , physics , quantum mechanics , communication
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