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Reliability of neuroanatomical measurements in a multi-site longitudinal study of youth at risk for psychosis
Author(s) -
Tyrone D. Can,
Frank F. Sun,
Sarah McEwen,
Xenophon Papademetris,
George He,
Theo G.M. van Erp,
Aron Jacobson,
Carrie Bearden,
Elaine F. Walker,
Xiaoping Hu,
Lian Zhou,
Larry J. Seidman,
Heidi W. Thermenos,
Barbara A. Cornblatt,
Doreen M. Olvet,
Diana O. Perkins,
Ayşenil Belger,
Kristin S. Cadenhead,
Ming T. Tsuang,
Heline Mirzakhanian,
Jean Addington,
Richard Frayne,
Scott W. Woods,
Thomas H. McGlashan,
R. Todd Constable,
Maolin Qiu,
Daniel H. Mathalon,
Paul M. Thompson,
Arthur W. Toga
Publication year - 2014
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/cmwp-mw22
Subject(s) - psychosis , reliability (semiconductor) , psychology , psychiatry , reliability engineering , clinical psychology , engineering , physics , power (physics) , quantum mechanics

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