Open AccessA combined universal generating function and physics of failure Reliability Prediction Method for an LED driver
Author(s) -
Liming Fan,
Kunsheng Wang,
Dongming Fan
Publication year - 2021
Publication title -
eksploatacja i niezawodnosc - maintenance and reliability
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 27
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2021.1.8
Subject(s) - reliability (semiconductor) , component (thermodynamics) , capacitor , reliability engineering , physics of failure , topology (electrical circuits) , electronic circuit , function (biology) , engineering , diode , computer science , electronic engineering , electrical engineering , voltage , physics , power (physics) , quantum mechanics , evolutionary biology , biology , thermodynamics
The accurate and effective reliability prediction of light emitting diode (LED) drivers hasemerged as a key issue in LED applications. However, previous studies have mainly focused on the reliability of electrolytic capacitors or other single components while ignoring circuit topology. In this study, universal generating function (UGF) and physics of failure (PoF) are integrated to predict the reliability of LED drivers. Utilizing PoF, lifetime data for each component are obtained. A system reliability model with multi-phase is established, and system reliability can be predicted using UGF. Illustrated by a two-channel LED driver, the beneficial effects of capacitors and MOSFETs for the reliability of LED drivers is verified. This study (i) provides a universal numerical approach to predict the lifetime of LED drivers considering circuit topology, (ii) enhances the modelling and reliability evaluation of circuits, and (iii) bridges the gap between component and circuit system levels.
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