z-logo
open-access-imgOpen Access
Reliability assessment for systems with two performance characteristics based on gamma processes with marginal heterogeneous random effects
Author(s) -
Luis Alberto RodríguezPicón
Publication year - 2016
Publication title -
eksploatacja i niezawodnosc - maintenance and reliability
Language(s) - English
Resource type - Journals
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2017.1.2
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , physics , engineering , power (physics) , quantum mechanics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom