Open AccessTHE METHOD OF FORECASTING CHARACTERISTICS OF METROLOGICAL RELIABILITY INFORMATIONAL-MEASURING SYSTEMS
Author(s) -
Evgeniy Anatoljevich Reutskiy,
Leonid Nikolaevich Scherbak
Publication year - 2014
Publication title -
teoretičeskaâ i prikladnaâ nauka
Language(s) - English
Resource type - Journals
eISSN - 2409-0085
pISSN - 2308-4944
DOI - 10.15863/tas.2014.12.20.8
Subject(s) - reliability (semiconductor) , metrology , reliability engineering , computer science , engineering , statistics , mathematics , physics , thermodynamics , power (physics)