On estimating a stress-strength type reliability
Author(s) -
M. Mahdizadeh
Publication year - 2016
Publication title -
hacettepe journal of mathematics and statistics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.312
H-Index - 26
ISSN - 1303-5010
DOI - 10.15672/hjms.201612418374
Subject(s) - mathematics , reliability (semiconductor) , type (biology) , statistics , stress (linguistics) , reliability engineering , ecology , power (physics) , linguistics , physics , philosophy , quantum mechanics , biology , engineering
This article deals with estimating an extension of the well-known stress-strength reliability in nonparametric setup. By means of Monte Carlo simulations, the proposed estimator is compared with its parametric analogs in the case of exponential distribution. The results show that the estimator could be highly effcient in many situations considered.
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