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Single-state electronic structure measurements using time-resolved x-ray laser induced photoelectron spectroscopy
Author(s) -
A. J. Nelson,
J. Dunn,
T. van Buuren,
James Hunter
Publication year - 2004
Publication title -
mrs proceedings
Language(s) - Uncategorized
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-840-q4.6
Subject(s) - materials science , x ray photoelectron spectroscopy , picosecond , ultrashort pulse , laser , photoemission spectroscopy , inverse photoemission spectroscopy , chemical state , angle resolved photoemission spectroscopy , pulse duration , valence electron , spectroscopy , time resolved spectroscopy , optics , semiconductor , valence (chemistry) , atomic physics , electron , analytical chemistry (journal) , optoelectronics , electronic structure , nuclear magnetic resonance , physics , chemistry , quantum mechanics , chromatography

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