Evolution of the Mobility Gap with Thickness in Hydrogen-Diluted Intrinsic Si:H Materials in the Phase Transition Region and Its Effect on p-i-n Solar Cell Characteristics
Author(s) -
R.J. Koval,
Joshua M. Pearce,
André S. Ferlauto,
R. W. Collins,
C. R. Wroński
Publication year - 2001
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-664-a16.4
Subject(s) - materials science , microcrystalline , amorphous solid , solar cell , microstructure , amorphous silicon , ellipsometry , hydrogen , analytical chemistry (journal) , condensed matter physics , crystalline silicon , crystallography , thin film , nanotechnology , optoelectronics , composite material , chemistry , physics , organic chemistry , chromatography
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