Open AccessQuantitative High Resolution Electron Microscopy of Grain Boundaries
Author(s) -
Geoffrey H. Campbell,
Wayne E. King,
Dov Cohen,
Barry Carter
Publication year - 1996
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-466-119
Subject(s) - materials science , tilt (camera) , micrograph , resolution (logic) , high resolution transmission electron microscopy , electron microscope , image (mathematics) , energy filtered transmission electron microscopy , transmission electron microscopy , electron tomography , grain boundary , image processing , scanning transmission electron microscopy , optics , microscopy , artificial intelligence , computer science , scanning electron microscope , nanotechnology , microstructure , geometry , mathematics , physics , metallurgy , composite material
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