Open AccessTransmission Electron Microscopy Study of Thick Copper-304 Stainless Steel Multilayers
Author(s) -
M. A. Wall,
Troy W. Barbee,
Timothy P. Weihs
Publication year - 1993
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-311-33
Subject(s) - materials science , transmission electron microscopy , copper , layer (electronics) , metastability , sputter deposition , electron diffraction , sputtering , crystallography , microstructure , epitaxy , composite material , metallurgy , diffraction , thin film , optics , nanotechnology , chemistry , physics , quantum mechanics
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