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Ultra-Soft X-Ray Absorption Spectroscopy: A Bulk and Surface Probe of Materials
Author(s) -
Daniel A. Fischer,
G. E. Mitchell,
Benjamin M. DeKoven,
Alvin T. Yeh,
John L. Gland,
A. R. Moodenbaugh
Publication year - 1993
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-307-101
Subject(s) - materials science , yield (engineering) , spectroscopy , absorption (acoustics) , analytical chemistry (journal) , absorption spectroscopy , fluorescence , fluorescence spectroscopy , xanes , x ray photoelectron spectroscopy , optics , chemical engineering , composite material , chemistry , organic chemistry , physics , quantum mechanics , engineering

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