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Neutron Irradiated Uranium Silicides Studied by Neutron Diffraction and Rietveld Analysis
Author(s) -
R. C. Birtcher,
M. H. Mueller,
James W. Richardson
Publication year - 1990
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-209-579
Subject(s) - materials science , rietveld refinement , neutron diffraction , crystallography , tetragonal crystal system , amorphous solid , uranium , neutron , analytical chemistry (journal) , crystal structure , nuclear physics , metallurgy , chemistry , physics , chromatography

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