Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale | Zendy

Dawn A. Bonnell | Zendy; Sergei V. Kalinin | Zendy; Andréi L. Kholkin | Zendy; Alexei Gruverman | Zendy

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Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Author(s) -

Dawn A. Bonnell,

Sergei V. Kalinin,

Andréi L. Kholkin,

Alexei Gruverman

Publication year - 2009

Publication title -

mrs bulletin

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.19

H-Index - 153

eISSN - 1938-1425

pISSN - 0883-7694

DOI - 10.1557/mrs2009.176

Subject(s) - nanolithography , nanotechnology , piezoresponse force microscopy , materials science , nanoscopic scale , ferroelectricity , biomolecule , lithography , scanning probe microscopy , optoelectronics , fabrication , medicine , alternative medicine , pathology , dielectric

Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

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