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In SituX-Ray Tomography Studies of Microstructural Evolution Combined with 3D Modeling
Author(s) -
JeanYves Buffière,
Peter Cloetens,
Wolfgang Ludwig,
Éric Maire,
L. Salvò
Publication year - 2008
Publication title -
mrs bulletin
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.19
H-Index - 153
eISSN - 1938-1425
pISSN - 0883-7694
DOI - 10.1557/mrs2008.126
Subject(s) - materials science , synchrotron , tomography , opacity , characterization (materials science) , microstructure , in situ , diffraction , micrometer , x ray , attenuation , optics , composite material , nanotechnology , physics , meteorology

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