Open AccessSequential multiplication of dislocation sources along a crack front revealed by high-voltage electron microscopy and tomography
Author(s) -
Masaki Tanaka,
Sunao Sadamatsu,
Grace S. Liu,
Hiroto Nakamura,
Kenji Higashida,
I.M. Robertson
Publication year - 2011
Publication title -
journal of materials research/pratt's guide to venture capital sources
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.788
H-Index - 148
eISSN - 0884-2914
pISSN - 0884-1616
DOI - 10.1557/jmr.2010.99
Subject(s) - materials science , dislocation , tomography , electron tomography , electron microscope , electron , multiplication (music) , voltage , crystallography , condensed matter physics , optics , composite material , scanning electron microscope , nuclear physics , scanning transmission electron microscopy , physics , quantum mechanics , acoustics , chemistry
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