Open AccessThe charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
Author(s) -
V.A. Ievtukh
Publication year - 2016
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo19.01.116
Subject(s) - trapping , materials science , electric field , non volatile memory , nanocrystalline material , optoelectronics , charge (physics) , silicon , engineering physics , nanotechnology , physics , ecology , quantum mechanics , biology