Open AccessMethodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
Author(s) -
V.S. Slipokurov
Publication year - 2015
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo18.02.144
Subject(s) - electrical resistivity and conductivity , semiconductor , materials science , engineering physics , resistance (ecology) , electrical resistance and conductance , contact resistance , optoelectronics , electrical engineering , composite material , physics , engineering , ecology , layer (electronics) , biology