Open AccessRadiation/annealing-induced structural changes in GexAs40-xS60 glasses as revealed from high-energy synchrotron X-ray diffraction measurements
Author(s) -
Taras Kavetskyy
Publication year - 2012
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo15.04.310
Subject(s) - synchrotron radiation , annealing (glass) , materials science , diffraction , x ray crystallography , synchrotron , radiation , optics , x ray , high energy , crystallography , physics , atomic physics , chemistry , metallurgy