Multiple-Interval Mapping for Ordinal Traits

Many statistical methods have been developed to map multiple quantitative trait loci (QTL) in experimental cross populations. Among these methods, multiple-interval mapping (MIM) can map QTL with epistasis simultaneously. However, the previous implementation of MIM is for continuously distributed traits. In this study we extend MIM to ordinal traits on the basis of a threshold model. The method inherits the properties and advantages of MIM and can fit a model of multiple QTL effects and epistasis on the underlying liability score. We study a number of statistical issues associated with the method, such as the efficiency and stability of maximization and model selection. We also use computer simulation to study the performance of the method and compare it to other alternative approaches. The method has been implemented in QTL Cartographer to facilitate its general usage for QTL mapping data analysis on binary and ordinal traits.