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Evaluation of next generation emission measurement technologies under repeatable test protocols
Author(s) -
Clay Bell,
Timothy L. Vaughn,
Daniel Zimmerle
Publication year - 2020
Publication title -
elementa science of the anthropocene
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.011
H-Index - 34
ISSN - 2325-1026
DOI - 10.1525/elementa.426
Subject(s) - mobile device , computer science , continuous monitoring , range (aeronautics) , reliability engineering , metrology , real time computing , environmental science , simulation , process engineering , engineering , statistics , mathematics , operations management , aerospace engineering , operating system
Twelve next generation emission measurement (NGEM) technologies completed single-blind testing at the Methane Emissions Technology Evaluation Center in 2018. This is the first series of tests to evaluate a wide variety of NGEM solutions including handheld, mobile, and continuous monitoring methods using comparable, repeatable protocols. Results assess performance of detection, localization and quantification, albeit with limited statistical significance due to a low number of tests. Overall, a higher detection rate is observed for handheld and mobile solutions than for continuous monitoring solutions. Compared to when a single emission source is present, a decline in detection rate is observed across all methods when multiple, steady emission sources are present. Localization by handheld and mobile solutions is more accurate than continuous monitoring solutions. These results support the common perception that detections by continuous monitoring systems will need to be confirmed and pinpointed by a follow-up inspection. Finally, this and other controlled release experiments, have been performed across a limited range of environmental conditions. To develop robust probability of detection curves needed for demonstrating emission reduction potential of leak detection and repair programs, new protocols are needed to evaluate methods across a wide range of metrological conditions and emission scenarios in a cost-effective manner.

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