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Trends in Time-of-Flight Parameters with Application to Autoionization Lifetime Measurements
Author(s) -
Seth Michael Hafferkamp
Publication year - 2012
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.14418/wes01.1.797
Subject(s) - autoionization , computer science , physics , ionization , ion , photoionization , quantum mechanics
i ACKNOWLEDGEMENTS iii NOMENCLATURE iv TABLE OF CONTENTS v LIST OF FIGURES AND TABLES vii CHAPTER

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