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Optical Properties of Ferroelectric Epitaxial K0.5Na0.5NbO3 Films in Visible to Ultraviolet Range
Author(s) -
E. Chernova,
O. Pacherová,
T. Kocourek,
M. Jelı́nek,
A. Dejneka,
M. Tyunina
Publication year - 2016
Publication title -
plos one
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.99
H-Index - 332
ISSN - 1932-6203
DOI - 10.1371/journal.pone.0153261
Subject(s) - materials science , ferroelectricity , epitaxy , refractive index , ellipsometry , ultraviolet , optoelectronics , optics , band gap , thin film , perovskite (structure) , polarization (electrochemistry) , crystallography , dielectric , nanotechnology , chemistry , physics , layer (electronics)
The complex index of refraction in the spectral range of 0.74 to 4.5 eV is studied by variable-angle spectroscopic ellipsometry in ferroelectric K 0.5 Na 0.5 NbO 3 films. The 20-nm-thick cube-on-cube-type epitaxial films are grown on SrTiO 3 (001) and DyScO 3 (011) single-crystal substrates. The films are transparent and exhibit a significant difference between refractive indices Δn = 0.5 at photon energies below 3 eV. The energies of optical transitions are in the range of 3.15–4.30 eV and differ by 0.2–0.3 eV in these films. The observed behavior is discussed in terms of lattice strain and strain-induced ferroelectric polarization in epitaxial perovskite oxide films.

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