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Determination of Acceptor Concentration, Depletion Width, Donor Level Movement and Sensitivity Factor of ZnO on Diamond Heterojunction under UV Illumination
Author(s) -
K.G. Saw,
S.S. Tneh,
F.K. Yam,
S.S. Ng,
Z. Hassan
Publication year - 2014
Publication title -
plos one
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.99
H-Index - 332
ISSN - 1932-6203
DOI - 10.1371/journal.pone.0089348
Subject(s) - heterojunction , depletion region , acceptor , band bending , materials science , ultraviolet , optoelectronics , sensitivity (control systems) , diamond , dark current , electron , doping , spectral sensitivity , analytical chemistry (journal) , optics , semiconductor , chemistry , physics , photodetector , condensed matter physics , wavelength , chromatography , quantum mechanics , electronic engineering , engineering , composite material
The concentration of acceptor carriers, depletion width, magnitude of donor level movement as well as the sensitivity factor are determined from the UV response of a heterojunction consisting of ZnO on type IIb diamond. From the comparison of the I-V measurements in dark condition and under UV illumination we show that the acceptor concentration (∼10 17 cm −3 ) can be estimated from p-n junction properties. The depletion width of the heterojunction is calculated and is shown to extend farther into the ZnO region in dark condition. Under UV illumination, the depletion width shrinks but penetrates both materials equally. The ultraviolet illumination causes the donor level to move closer to the conduction band by about 50 meV suggesting that band bending is reduced to allow more electrons to flow from the intrinsically n-type ZnO. The sensitivity factor of the device calculated from the change of threshold voltages, the ratio of dark and photocurrents and identity factor is consistent with experimental data.

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