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Exploring the Nanoscale: Fifteen Years of Tip-Enhanced Raman Spectroscopy
Author(s) -
Lucas Langelüddecke,
Prabha Singh,
Volker Deckert
Publication year - 2015
Publication title -
applied spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 110
eISSN - 1943-3530
pISSN - 0003-7028
DOI - 10.1366/15-08014
Subject(s) - raman spectroscopy , nanoscopic scale , chemical imaging , nanometre , resolution (logic) , nanotechnology , spectroscopy , materials science , microscopy , diffraction , optics , image resolution , surface enhanced raman spectroscopy , analytical chemistry (journal) , chemistry , raman scattering , hyperspectral imaging , remote sensing , physics , computer science , chromatography , quantum mechanics , artificial intelligence , geology
Spectroscopic methods with high spatial resolution are essential to understand the physical and chemical properties of nanoscale materials including biological and chemical materials. Tip-enhanced Raman spectroscopy (TERS) is a combination of surface-enhanced Raman spectroscopy (SERS) and scanning probe microscopy (SPM), which can provide high-resolution topographic and spectral information simultaneously below the diffraction limit of light. Even examples of sub-nanometer resolution have been demonstrated. This review intends to give an introduction to TERS, focusing on its basic principle and the experimental setup, the strengths followed by recent applications, developments, and perspectives in this field.

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