Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode | Zendy

YuPing Lan | Zendy; Yea-Feng Lin | Zendy; Yutai Li | Zendy; RuPin Pan | Zendy; Chao-Kuei Lee | Zendy; CiLing Pan | Zendy

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Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode

Author(s) -

YuPing Lan,

Yea-Feng Lin,

Yutai Li,

RuPin Pan,

Chao-Kuei Lee,

CiLing Pan

Publication year - 2005

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.13.007905

Subject(s) - materials science , optics , laser , diode , liquid crystal , wavelength , optoelectronics , planar , phase (matter) , chemistry , physics , computer graphics (images) , organic chemistry , computer science

The gap of a planar-aligned liquid crystal (LC) cell is measured by a novel method: Monitoring the change in output wavelength of an external-cavity diode laser by varying the voltage driving the LC cell placed in the laser cavity. This method is particularly suitable for measurement of LC cells of small phase retardation. Measurement errors of +/-0.5 % and +/-0.6 % for 9.6-microm and 4.25-microm cells with phase retardations of 1.63 microm and 0.20 microm respectively are demonstrated.

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