High resolution optical frequency domain reflectometry for characterization of components and assemblies | Zendy

Brian J. Soller | Zendy; Dawn K. Gifford | Zendy; Matthew S. Wolfe | Zendy; Mark E. Froggatt | Zendy

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High resolution optical frequency domain reflectometry for characterization of components and assemblies

Author(s) -

Brian J. Soller,

Dawn K. Gifford,

Matthew S. Wolfe,

Mark E. Froggatt

Publication year - 2005

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.13.000666

Subject(s) - optics , reflectometry , materials science , fiber bragg grating , polarization (electrochemistry) , birefringence , metrology , impulse response , optical fiber , time domain , physics , mathematical analysis , chemistry , mathematics , computer science , computer vision

We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR's versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.

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