Refractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy | Zendy

Paul Pace | Zendy; S. T. Huntington | Zendy; K. Lyytik�inen | Zendy; Ann Roberts | Zendy; Jamie Love | Zendy

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Refractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy

Author(s) -

Paul Pace,

S. T. Huntington,

K. Lyytik�inen,

Ann Roberts,

Jamie Love

Publication year - 2004

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.12.001452

Subject(s) - materials science , germanium , refractive index , hydrofluoric acid , optics , scanning electron microscope , doping , nanometre , atomic force microscopy , optoelectronics , silicon , nanotechnology , composite material , physics , metallurgy

We show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning Electron Microscope (SEM) and a RIP of the fiber measured using a commercial profiling instrument, and were found to be in excellent agreement. It is now possible to calculate the RIP of a germanium doped fiber directly from an AFM profile.

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