Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength | Zendy

C. Traum | Zendy; Patrícia Loren Inácio | Zendy; C. Félix | Zendy; Patricia Segonds | Zendy; Alexandra Peña | Zendy; Jérôme Debray | Zendy; Benoı̂t Boulanger | Zendy; Yannick Petit | Zendy; Daniel Rytz | Zendy; Germano Montemezzani | Zendy; Philippe Goldner | Zendy; Alban Ferrier | Zendy

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Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

Author(s) -

C. Traum,

Patrícia Loren Inácio,

C. Félix,

Patricia Segonds,

Alexandra Peña,

Jérôme Debray,

Benoı̂t Boulanger,

Yannick Petit,

Daniel Rytz,

Germano Montemezzani,

Philippe Goldner,

Alban Ferrier

Publication year - 2013

Publication title -

optical materials express

Language(s) - English

Resource type - Journals

ISSN - 2159-3930

DOI - 10.1364/ome.4.000057

Subject(s) - monoclinic crystal system , dielectric , materials science , optics , rotation (mathematics) , wavelength , frame (networking) , orientation (vector space) , measure (data warehouse) , optoelectronics , crystallography , physics , crystal structure , chemistry , telecommunications , geometry , mathematics , database , computer science

International audienceWe report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO

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