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Modeling of InGaN p-n junction solar cells
Author(s) -
ShihWei Feng,
Chih-Ming Lai,
ChinYi Tsai,
Yu-Ru Su,
Li-Wei Tu
Publication year - 2013
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.3.001777
Subject(s) - materials science , optoelectronics , indium , energy conversion efficiency , solar cell , open circuit voltage , short circuit , absorption (acoustics) , indium gallium nitride , voltage , gallium nitride , nanotechnology , layer (electronics) , physics , quantum mechanics , composite material
InGaN p-n junction solar cells with various indium composition and thickness of upper p-InGaN and lower n-InGaN junctions are investigated theoretically. The physical properties of InGaN p-n junction solar cells, such as the short circuit current density (JSC), open circuit voltage (Voc), fill factor (FF), and conversion efficiency (η), are theoretically calculated and simulated by varying the device structures, position of the depletion region, indium content, and photon penetration depth. The results indicate that an In0.6Ga0.4N solar cell, with optimal device parameters, can have a JSC ~31.8 mA/cm2, Voc ~0.874 volt, FF ~0.775, and η ~21.5%. It clearly demonstrates that medium-indium-content InGaN materials have the potential to realize high efficiency solar cells. Furthermore, the simulation results, with various thicknesses of the p-InGaN junction but a fixed thickness of the n-InGaN junction, shows that the performance of InGaN solar cells is determined by the upper p-InGaN junction rather than the n-InGaN substrate. This is attributed to the different amount of light absorption in the depletion region and the variation of the collection efficiency of minority carriers.

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