Sensitive photothermal deflection technique for measuring absorption in optically thin media | Zendy

A. C. Boccara | Zendy; Warren B. Jackson | Zendy; Nabil M. Amer | Zendy; D. Fournier | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Sensitive photothermal deflection technique for measuring absorption in optically thin media

Author(s) -

A. C. Boccara,

Warren B. Jackson,

Nabil M. Amer,

D. Fournier

Publication year - 1980

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.5.000377

Subject(s) - photothermal therapy , optics , materials science , photothermal spectroscopy , thin film , deflection (physics) , lens (geology) , attenuation coefficient , limiting , refractive index , absorption (acoustics) , thermal , optoelectronics , physics , nanotechnology , mechanical engineering , engineering , meteorology

We present a highly sensitive and simple photothermal scheme for determining optical absorptions in condensed matter samples. {alpha}l values as low as 10{sup -7} and 10{sup -8} were measured for thin films and coatings and for liquids, respectively. A comparison with thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research