
Ultralow 0.034 dB/m loss wafer-scale integrated photonics realizing 720 million Q and 380 μW threshold Brillouin lasing
Author(s) -
Kaikai Liu,
Naijun Jin,
Hong Cheng,
Nitesh Chauhan,
Matthew W. Puckett,
Karl Nelson,
Ryan O. Behunin,
Peter T. Rakich,
D.J. Blumenthal
Publication year - 2022
Publication title -
optics letters/optics index
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.454392
Subject(s) - materials science , optoelectronics , brillouin scattering , chemical vapor deposition , optics , laser linewidth , photonics , plasma enhanced chemical vapor deposition , resonator , wafer , lasing threshold , laser , wavelength , physics