Transport properties of optically thin solid dielectrics from frequency correlations of randomly scattered light | Zendy

Geoffroy J. Aubry | Zendy; Nathan Fuchs | Zendy; S. E. Skipetrov | Zendy; Frank Scheffold | Zendy

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Transport properties of optically thin solid dielectrics from frequency correlations of randomly scattered light

Author(s) -

Geoffroy J. Aubry,

Nathan Fuchs,

S. E. Skipetrov,

Frank Scheffold

Publication year - 2022

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.449084

Subject(s) - optics , speckle pattern , materials science , dielectric , optical path length , light scattering , diffusion , light intensity , spatial frequency , intensity (physics) , correlation function (quantum field theory) , mean free path , scattering , physics , optoelectronics , thermodynamics

Frequency-dependent intensity correlation function measurements can be employed to determine the optical turbidity of solid disordered dielectrics. Here we demonstrate a speckle frequency correlation experiment with a focused beam and using an area detector. We show how to apply frequency correlation measurements to optically thin solid samples with the aim of determining the light diffusion coefficient and transport mean free path ℓ*. To give a practical example, we extract the optical transport mean free path of PTFE (Teflon) slabs, with a thickness of L = 0.4-3.5 mm, covering optical densities L/ℓ* ∼ 4-15.

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