Integrated broadband dual-polarization Ge-rich SiGe mid-infrared Fourier-transform spectrometer
Author(s) -
Qiankun Liu,
Joan Manel Ramírez,
Vladyslav Vakarin,
Xavier Le Roux,
Carlos AlonsoRamos,
Jacopo Frigerio,
Andrea Ballabio,
Enrico Talamas Simola,
David Bouville,
Laurent Vivien,
Giovanni Isella,
Delphine MarrisMorini
Publication year - 2018
Publication title -
optics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.43.005021
Subject(s) - optics , broadband , spectrometer , infrared , materials science , fourier transform infrared spectroscopy , fourier transform , polarization (electrochemistry) , fourier transform spectroscopy , optoelectronics , physics , chemistry , quantum mechanics
Miniaturized on-chip spectrometers covering a wide band of the mid-infrared spectrum have an immense potential for multi-target detection in high-impact applications, such as chemical sensing or environmental monitoring. Specifically, multi-aperture spatial heterodyne Fourier-transform spectrometers (SHFTS) provide high throughput and improved tolerance against fabrication errors, compared to conventional counterparts. Still, state-of-the-art implementations have only shown single-polarization operation in narrow bandwidths within the near and short infrared. Here, we demonstrate the first, to the best of our knowledge, dual-polarization ultra-wideband SHFTS working beyond 5 μm wavelength. We exploit the unique flexibility in material engineering of the graded-index germanium-rich silicon-germanium (Ge-rich SiGe) photonic platform to implement a SHFTS that can be operated in an unprecedented range of 800 cm -1 , showing experimental resolution better than 15 cm -1 for both orthogonal polarizations and free spectral range of 132 cm -1 , in the wavelength range between 5 and 8.5 μm.
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