High-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification | Zendy

Lotfi Berguiga | Zendy; R. Orobtchouk | Zendy; Juan Elezgaray | Zendy; A. Arnéodo | Zendy; Françoise Argoul | Zendy

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High-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification

Author(s) -

Lotfi Berguiga,

R. Orobtchouk,

Juan Elezgaray,

A. Arnéodo,

Françoise Argoul

Publication year - 2017

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.42.002523

Subject(s) - optics , materials science , refractive index , resolution (logic) , waveguide , microscopy , image resolution , dielectric , diffraction , near field scanning optical microscope , microscope , optical microscope , scanning electron microscope , optoelectronics , physics , artificial intelligence , computer science

International audienceWe report on a high-resolution metal-clad waveguide scanning microscopic method with a diffraction-limited resolution. This microscope can be operated in both TM and TE waveguide modes with radially and azimuthally polarized beams, respectively, and allows both refractive index and topography of dielectric objects to be evaluated at high resolution and sensitivity. We emphasize the performance of this microscopic method from calibrated 3D polymer microstructures with rectangular, disk, and ring shapes

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