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Super-resolution in diffractive imaging from hemispherical elastic light scattering data
Author(s) -
Sergiy Lysenko,
V. A. Sterligov,
Manuel R. Gonçalves,
Armando Rúa,
Iaroslav Gritsayenko,
Félix E. Fernández
Publication year - 2017
Publication title -
optics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.42.002263
Subject(s) - optics , point spread function , autocorrelation , scattering , metrology , spectral density , phase retrieval , harmonics , ptychography , surface (topology) , resolution (logic) , physics , iterative reconstruction , light scattering , image resolution , diffraction , fourier transform , computer science , mathematics , geometry , telecommunications , statistics , quantum mechanics , voltage , artificial intelligence
Angle-resolved hemispherical elastic light scattering techniques have been used to reconstruct the surface profile of two-dimensional photonic crystals with submicron resolution and metrological precision. Iterative algorithms permit subsequent calculation of a surface autocorrelation function with additional numerical approximation of the power spectrum and then yield final reconstruction of the surface shape. The proposed method enables filtering out unwanted scattering background, precluding the convergence of phase-retrieval algorithms. The estimation of higher harmonics in the power spectrum provides the reconstruction of a realistic surface achieving subwavelength resolution.

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