Ultrashort pulse characterization with a terahertz streak camera | Zendy

O. Schubert | Zendy; Claudius Riek | Zendy; F. Junginger | Zendy; Alexander Sell | Zendy; Alfred Leitenstorfer | Zendy; R. Huber | Zendy

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Ultrashort pulse characterization with a terahertz streak camera

Author(s) -

O. Schubert,

Claudius Riek,

F. Junginger,

Alexander Sell,

Alfred Leitenstorfer,

R. Huber

Publication year - 2011

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.36.004458

Subject(s) - optics , ultrashort pulse , terahertz radiation , streak camera , femtosecond , detector , polarization (electrochemistry) , femtosecond pulse shaping , physics , wavelength , materials science , laser , chemistry

A phase-locked terahertz transient is exploited as an ultrafast phase gate for femtosecond optical pulses. We directly map out the group delay dispersion of a low-power near-infrared pulse by measuring the electro-optically induced polarization rotation as a function of wavelength. Our experiment covers the spectral window from 1.0 to 1.4 μm and reaches a temporal precision better than 1 fs. A quantitative analysis of the detector response confirms that this streaking technique requires no reconstruction algorithm and is also well suited for the characterization of pulses spanning more than one optical octave.

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