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Kerr spatial solitons in chalcogenide waveguides
Author(s) -
Mathieu Chauvet,
G. Fanjoux,
Kien Phan Huy,
Virginie Nazabal,
Frédéric Charpentier,
Thierry Billeton,
Georges Boudebs,
Michel Cathelinaud,
Simon-Pierre Gorza
Publication year - 2009
Publication title -
optics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.34.001804
Subject(s) - chalcogenide , optics , kerr effect , materials science , soliton , wafer , refractive index , wavelength , chalcogenide glass , optoelectronics , thin film , silicon , nonlinear optics , sputtering , electron beam lithography , physics , nonlinear system , resist , layer (electronics) , laser , quantum mechanics , nanotechnology , composite material
Kerr spatial solitons are observed in slab chalcogenide waveguides at near-IR wavelengths. Waveguides are realized either by electron-beam evaporation or rf sputtering of a Ge-Sb-S compound deposited on oxidized silicon wafer. The Kerr coefficient of the thin film is evaluated to be 5 x 10(-18) m(2)/W from the experimentally required soliton power at 1.5 mum. Limitations due to material photosensitivity are revealed.

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