Extended focus depth for Fourier domain optical coherence microscopy | Zendy

Rainer A. Leitgeb | Zendy; Martin Villiger | Zendy; A. H. Bachmann | Zendy; L. Steinmann | Zendy; Theo Lasser | Zendy

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Extended focus depth for Fourier domain optical coherence microscopy

Author(s) -

Rainer A. Leitgeb,

Martin Villiger,

A. H. Bachmann,

L. Steinmann,

Theo Lasser

Publication year - 2006

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.31.002450

Subject(s) - optics , transverse plane , fourier transform , optical coherence tomography , microscopy , materials science , sapphire , coherence (philosophical gambling strategy) , resolution (logic) , coherence length , laser , physics , superconductivity , structural engineering , quantum mechanics , artificial intelligence , computer science , engineering

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of approximately 1.5 microm along a focal range of 200 microm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 microm in air.

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