Structure sensitivity in third-harmonic generation microscopy | Zendy

Delphine Débarre | Zendy; Willy Supatto | Zendy; Emmanuel Beaurepaire | Zendy

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Structure sensitivity in third-harmonic generation microscopy

Author(s) -

Delphine Débarre,

Willy Supatto,

Emmanuel Beaurepaire

Publication year - 2005

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.30.002134

Subject(s) - optics , signal (programming language) , modulation (music) , microscopy , rayleigh length , beam (structure) , sensitivity (control systems) , harmonic , excitation , materials science , rayleigh scattering , physics , laser beams , acoustics , laser , computer science , quantum mechanics , electronic engineering , programming language , engineering

We characterize experimentally the influence of sample structure and beam focusing on signal level in third-harmonic generation (THG) microscopy. In the case of a homogeneous spherical sample, the dependence of the signal on the size of the sphere can be controlled by modifying the Rayleigh length of the excitation beam. More generally, the influence of excitation focusing on the signal depends on sample geometry, allowing one to highlight certain structures within a complex system. We illustrate this point by focusing-based contrast modulation in THG images of Drosophila embryos.

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