Temperature dependence of optical properties for amorphous silicon at wavelengths of 6328 and 752 nm | Zendy

Oğuz Yavaṣ | Zendy; Nhan Do | Zendy; A. C. Tam | Zendy; P. T. Leung | Zendy; W. P. Leung | Zendy; Hee K. Park | Zendy; Costas P. Grigoropoulos | Zendy; Johannes Boneberg | Zendy; P. Leǐderer | Zendy

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Temperature dependence of optical properties for amorphous silicon at wavelengths of 6328 and 752 nm

Author(s) -

Oğuz Yavaṣ,

Nhan Do,

A. C. Tam,

P. T. Leung,

W. P. Leung,

Hee K. Park,

Costas P. Grigoropoulos,

Johannes Boneberg,

P. Leǐderer

Publication year - 1993

Publication title -

optics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.18.000540

Subject(s) - refractive index , materials science , molar absorptivity , wavelength , optics , amorphous silicon , amorphous solid , extinction (optical mineralogy) , silicon , attenuation coefficient , temperature coefficient , extinction ratio , optoelectronics , crystalline silicon , physics , chemistry , organic chemistry , composite material

The temperature dependence of the optical properties for amorphous silicon is studied at wavelengths of 632.8 and 752 nm. Both the refractive index and extinction coefficient increase linearly with temperature for 752 nm, while the refractive index decreases and the extinction coefficient increases for 632.8 nm. The rate of increase of the extinction coefficient at 632.8 nm is twice as much as that for 752 nm.

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