Breakthrough spectrophotometric instrument for the ultra-fine characterization of the spectral transmittance of thin-film optical filters
Author(s) -
Michel Lequime,
Myriam Zerrad,
Claude Amra
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.034236
Subject(s) - transmittance , optics , characterization (materials science) , materials science , interference (communication) , nanometre , spectral resolution , optical filter , visible spectrum , thin film , optical instrument , optoelectronics , computer science , physics , spectral line , nanotechnology , telecommunications , channel (broadcasting) , astronomy
In this paper, we provide a detailed description of the main features of the upgraded version of a spectrophotometric apparatus developed by our team since 2014 [ Opt. Express23, 26863 (2015)]), and whose improved performance allows the characterization over the visible and near infrared part of the spectrum of the transmittance of complex interference filters with high spectral resolution (approximately one tenth of a nanometer) and an extremely wide dynamic range (thirteen decades).
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom