Room-temperature electrically-pumped 15 μm InGaAs/InAlGaAs laser monolithically grown on on-axis (001) Si
Author(s) -
Si Zhu,
Bei Shi,
Qiang Li,
Kei May Lau
Publication year - 2018
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.26.014514
Subject(s) - optoelectronics , materials science , laser , lasing threshold , metalorganic vapour phase epitaxy , chemical vapor deposition , photonics , silicon , substrate (aquarium) , diode , semiconductor laser theory , photonic integrated circuit , indium gallium arsenide , quantum well , optics , gallium arsenide , epitaxy , wavelength , layer (electronics) , nanotechnology , oceanography , physics , geology
Hetero-epitaxial growth of high quality InP on a complementary metal-oxide-semiconductor (CMOS)-compatible Si platform is compelling for monolithic integration of optoelectronics. It will provide the combined strength of mainstream mature InP-based photonic integrated circuits (PIC) technologies and large-volume, low-cost silicon-based manufacturing foundries. Direct monolithic integration of InP-based laser diodes (LDs) on silicon helps fully exploit the potential of silicon photonics and benefits the application of dense wavelength division multiplexing (DWDM) for telecommunications. Here, we report the first InGaAs/InAlGaAs multi-quantum-well (MQW) lasers directly grown on on-axis V-grooved (001) Si by metalorganic chemical vapor deposition (MOCVD). Lasing near 1.5 μm was achieved for the first time with a threshold current density J h = 3.3 kA/cm 2 under pulsed current injection at room temperature. A high characteristic temperature T 0 of 133 K in the range of 20°C-40°C was measured. These results demonstrate the potential of adopting this large-area InP-on-Si substrate for integrating diverse III-V laser diodes, photodetectors, and high-frequency and high-speed transistors.
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