Optical properties of Cu_2ZnSnSe_4 thin films and identification of secondary phases by spectroscopic ellipsometry | Zendy

Özden Demircioğlu | Zendy; J. F. López Salas | Zendy; Germain Rey | Zendy; Thomas Paul Weiss | Zendy; Marina Mousel | Zendy; Alex Redinger | Zendy; Susanne Siebentritt | Zendy; Jürgen Parisi | Zendy; Levent Gütay | Zendy

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Optical properties of Cu_2ZnSnSe_4 thin films and identification of secondary phases by spectroscopic ellipsometry

Author(s) -

Özden Demircioğlu,

J. F. López Salas,

Germain Rey,

Thomas Paul Weiss,

Marina Mousel,

Alex Redinger,

Susanne Siebentritt,

Jürgen Parisi,

Levent Gütay

Publication year - 2017

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.25.005327

Subject(s) - refractive index , materials science , ellipsometry , optics , molar absorptivity , band gap , thin film , phase (matter) , analytical chemistry (journal) , optoelectronics , chemistry , nanotechnology , physics , chromatography , organic chemistry

We apply spectroscopic ellipsometry (SE) to identify secondary phases in Cu 2 ZnSnSe 4 (CZTSe) absorbers and to investigate the optical properties of CZTSe. A detailed optical model is used to extract the optical parameters, such as refractive index and extinction coefficient in order to extrapolate the band gap values of CZTSe samples, and to obtain information about the presence of secondary phases at the front and back sides of the samples. We show that SE can be used as a non-destructive method for detection of the secondary phases ZnSe and MoSe 2 and to extrapolate the band gap values of CZTSe phase.

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