Experimental and numerical studies of the scattering of light from a two-dimensional randomly rough interface in the presence of total internal reflection: optical Yoneda peaks

The scattering of polarized light from a dielectric film sandwiched between two different semi-infinite dielectric media is studied experimentally and theoretically. The illuminated interface is planar, while the back interface is a two-dimensional randomly rough interface. We consider here only the case in which the medium of incidence is optically more dense than the substrate, in which case effects due to the presence of a critical angle for total internal reflection occur. A reduced Rayleigh equation for the scattering amplitudes is solved by a rigorous, purely numerical, nonperturbative approach. The solutions are used to calculate the reflectivity of the structure and the mean differential reflection coefficient. Optical analogues of Yoneda peaks are present in the results obtained. The computational results are compared with experimental data for the in-plane mean differential reflection coefficient, and good agreement between theory and experiment is found.